Computer-aided visual inspection of surface defects in ceramic capacitor chips

Journal of Materials Processing Technology

Volumn 189, Issue 1-3, 2007, Pages 19-25

  Lin, Hong Dar ^a  

^a CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Hotelling T2 multivariate statistics; Machine vision system; Surface defect inspection; Wavelet characteristics

Indexed keywords

CERAMIC CAPACITORS; COMPUTER AIDED ANALYSIS; COMPUTER VISION; INSPECTION; MULTIVARIABLE SYSTEMS; WAVELET ANALYSIS;

MACHINE VISION SYSTEMS; MULTIVARIATE STATISTICS; SURFACE BARRIER LAYER (SBL) CHIPS; SURFACE DEFECT INSPECTION; WAVELET CHARACTERISTICS;

SURFACE DEFECTS;

EID: 34047226253     PISSN: 09240136     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmatprotec.2006.12.051     Document Type: Article

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