Signature analysis and defect detection in layered manufacturing of ceramic sensors and actuators

Machine Vision and Applications

Volumn 15, Issue 2, 2003, Pages 63-75

  Fang, Tong ^a   Jafari, Mohsen A ^b   Danforth, Stephen C ^c   Safari, Ahmad ^c  

^a SIEMENS CORPORATE RESEARCH   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

^c RUTGERS UNIVERSITY   (United States)

Author keywords

Defect detection; Fused deposition of ceramics; Inspection system; Layered manufacturing; Signature analysis

Indexed keywords

ACTUATORS; CERAMIC MATERIALS; COMPUTATIONAL GEOMETRY; COMPUTER AIDED DESIGN; DEFECTS; ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; IMAGE ANALYSIS; MONITORING; PROCESS ENGINEERING; SENSORS;

DEFECT DETECTION; FUSED DEPOSITION OF CERAMICS; INSPECTION SYSTEM; SIGNATURE ANALYSIS;

LAYERED MANUFACTURING;

EID: 21144445430     PISSN: 09328092     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00138-002-0074-1     Document Type: Article

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