Wavelet based methods on patterned fabric defect detection

Pattern Recognition

Volumn 38, Issue 4, 2005, Pages 559-576

  Ngan, Henry Y T ^a   Pang, Grantham K H ^a   Yung, S P ^a   Ng, Michael K ^a  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Defect detection; Patterned fabric inspection; Patterned texture; Texture analysis; Wavelet transform

Indexed keywords

DEFECTS; DISCOLORATION; FABRICS; FOURIER TRANSFORMS; IMAGE ANALYSIS; TEXTURES; WAVELET TRANSFORMS;

DEFECT DETECTION; GOLDEN IMAGE SUBSTRACTION (GIS) METHOD; PATTERNED FABRIC INSPECTION; PATTERNED TEXTURE; TEXTURE ANALYSIS;

PATTERN RECOGNITION;

DEFECT DETECTORS; DISCOLORATION; FABRIC; FOURIER ANALYSIS; IMAGE ANALYSIS; PATTERN RECOGNITION; TEXTURE; WEAVING;

EID: 10644264358     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2004.07.009     Document Type: Article

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