Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition

International Journal of Production Research

Volumn 42, Issue 20, 2004, Pages 4331-4351

  Lu, C J ^a   Tsai, D M ^a  

^a YUAN ZE UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; DECOMPOSITION; DEFECTS; IMAGE RECONSTRUCTION; INDEPENDENT COMPONENT ANALYSIS; LIQUID CRYSTAL DISPLAYS; OPTICAL RESOLVING POWER; PERSONAL COMPUTERS; PERSONAL DIGITAL ASSISTANTS;

CELLULAR PHONES; IMAGE RESOLUTIONS; MICRODEFECTS; PINHOLES;

THIN FILM TRANSISTORS;

EID: 13644275273     PISSN: 00207543     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207540410001716480     Document Type: Article

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