Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques

International Journal of Production Research

Volumn 43, Issue 1, 2005, Pages 67-80

  Jiang, B C ^a   Wang, C C ^b   Liu, H C ^c  

^a YUAN ZE UNIVERSITY   (Taiwan)

^b MING CHI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^c CHUNGHWA PICTURE TUBES LTD   (Taiwan)

Author keywords

Analysis of variance (ANOVA); Defects inspection; Exponentially weighted moving average (EWMA); Liquid crystal display (LCD)

Indexed keywords

DISPLAY DEVICES; INSPECTION; MANUFACTURE;

INSPECTION PROCESS; LCD PANELS; LCD PRODUCTS;

LIQUID CRYSTAL DISPLAYS;

EID: 27844501085     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540412331285832     Document Type: Article

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