Test and testability of a monolithic MEMS for magnetic field sensing

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 17, Issue 5, 2001, Pages 439-450

  Beroulle, V ^a   Bertrand, Y ^a   Latorre, L ^a   Nouet, P ^a  

^a UNIV MONTPELLIER   (France)

Author keywords

Design for testability; Low cost testing; MEMS testing; Production testing

Indexed keywords

COSTS; DESIGN FOR TESTABILITY; FAILURE ANALYSIS; MAGNETIC FIELDS; MICROELECTROMECHANICAL DEVICES; MONOLITHIC INTEGRATED CIRCUITS; PIEZOELECTRIC DEVICES;

FAULT CLASSIFICATION; LORENTZ FORCE; MAGNETIC FIELD SENSOR; PIEZORESISTORS; TEST POINT INSERTION;

INTEGRATED CIRCUIT TESTING;

EID: 0035490532     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1012759320563     Document Type: Article

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