A comparative investigation of thickness measurements of ultra-thin water films by scanning probe techniques

Journal of Applied Physics

Volumn 101, Issue 6, 2007, Pages

  Opitz, A ^a,b   Scherge, M ^c,d   Ahmed, S I U ^b   Schaefer, J A ^b  

^a UNIVERSITY OF AUGSBURG   (Germany)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^c IAVF Antriebstechnik AG   (Germany)

^d FRAUNHOFER INSTITUTE FOR MECHANICS OF MATERIALS IWM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRON TUNNELING; SCANNING TUNNELING MICROSCOPY; ULTRATHIN FILMS; VACUUM APPLICATIONS;

DYNAMIC FORCE SPECTROSCOPY; SCANNING PROBE TECHNIQUES; ULTRA-HIGH VACUUM SYSTEM;

FILM THICKNESS;

EID: 34047096825     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2712155     Document Type: Article

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