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Volumn 934, Issue , 2006, Pages 20-25

Visible-blind UV/IR photodetectors integrated on Si substrates

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELLIPSOMETRY; NITRIDES; SEMICONDUCTOR MATERIALS; SILICON; SILICON WAFERS; SPECTROSCOPIC ANALYSIS;

MECHANICAL STRESS; MULTI SPECTRAL PHOTORESPONSE; SEMICONDUCTING LAYERS;

PHOTODETECTORS;

EID: 33947625223 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-0934-i09-04 Document Type: Conference Paper

Times cited : (3)

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