Evidence of the C 60/Cu contact formation after thermal treatment

Applied Physics Letters

Volumn 88, Issue 15, 2006, Pages

  Cho, S W ^a   Seo, J H ^a   Kim, C Y ^a   Yoo, K H ^a   Jeong, K ^a   Whang, C N ^a   Yi, Y ^b   Kang, S J ^c   Noh, M ^d  

^a Yonsei University   (South Korea)

^b University of South Florida   (United States)

^c United States of America   (United States)

^d LOT Vacuum Co Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON INJECTION BARRIER; ENERGY LEVEL DIAGRAM; MOLECULAR ORBITAL LEVEL;

ELECTRON ENERGY LEVELS; FERMI LEVEL; HEAT TREATMENT; ORBITS; X RAY PHOTOELECTRON SPECTROSCOPY;

FULLERENES;

EID: 33646147358     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2193038     Document Type: Article

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