High-temperature (1500 K) reciprocal space mapping on a laboratory X-ray diffractometer

Journal of Applied Crystallography

Volumn 40, Issue 2, 2007, Pages 332-337

  Guinebretiere R ^a   Boulle, A ^a   Bachelet, R ^a   Masson, O ^a   Thomas, P ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

Epitaxic thin films; High temperature X ray diffraction; Sample holder

Indexed keywords

EID: 33947322505     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807003433     Document Type: Article

References (37)

1. Bai, F., Zheng, H., Cao, H., Cross, L.E., Ramesh, R., Li, J. & Viehland, D. (2004). Appl. Phys. Lett. 85, 4109-4111.
2. Boulle, A., Canale, L., Guinebretiè re, R., Girault-DiBin, C. & Dauger, A. (2003). Thin Solid Films, 429, 55-62.
3. Boulle, A., Guinebretiè re, R. & Dauger, A. (2005). J. Appl. Phys. 97, 073503, 1-8.
4. Boulle, A., Masson, O., Guinebretiè re, R. & Dauger, A. (2001). Appl. Surf. Sci. 180, 322-327.
5. Boulle, A, Masson, O., Guinebretière, R. & Dauger, A. (2004). Diffraction Analysis of the Microstructure of Materials, Vol. 68, pp. 505-526. Berlin: Springer Series in Materials Science.
6. Boulle, A., Masson, O., Guinebretière, R., Lecomte, A. & Dauger, A. (2002). J. Appl. Cryst. 35, 606-614.
7. Brown, N. E., Swapp, S. M., Bennet, C. L. & Navrotsky, A. (1993). J. Appl. Cryst. 26, 77-81.
8. Chrosch, J. & Salje, E. K. H. (1997). Ferroelectrics, 194, 149-159.
9. Estermann, M., Reifler, H., Steurer, W., Filser, F., Kocher, P. & Gaucher, L. J. (1999). J. Appl. Cryst. 32, 833-836.
10. Evain, M., Deniard, P., Jouanneaux, A. & Brec, R. (1993). J. Appl. Cryst. 26, 563-569.
11. Fewster, P. F. (1997). Crit. Rev. Solid State Mater. Sci. 22, 69-110.
12. Fong, D. D., Thompson, C., Streiffer, S. K., Eastman, J. A., Auriciello, O., Fuoss, P. H. & Stephenson G. B. (2004). Ann. Phys. 13, 27-30.
13. Frost, H. J. (1994). Mater. Charac. 32, 257-273.
14. Gualtieri, A. F., Mazzucato, E., Venturelli, P., Viani, A., Zannini, P. & Petras, L. (1999). J. Appl. Cryst. 32, 808-813.
15. Guinebretière, R. (2006). X-ray Diffraction by Polycrystalline Samples. London: Hermes Science Publishing.
16. Guinebretière, R., Boulle, A., Masson, O. & Dauger, A. (2005). Powder Diffr. 20, 294-305.
17. Guinebretière, R., Dauger, A., Masson, O. & Soulestin, B. (1999). Philos. Mag. A, 79, 1517-1531.
18. Guinebretière, R., Soulestin, B. & Dauger, A. (1998). Thin Solid Films, 319, 197-201.
19. Jiang, L., Al-Mosheky, Z. & Grupido, N. (2002). Powder Diffr. 17, 81-93.
20. Kim, Y. K., Lee, K. & Baik, S. (2004). J. Appl. Phys. 95, 236-240.
21. Lee, K. & Baik, S. (1999). J. Appl. Phys. 85, 1995-1997.
22. Louër, D., Louër, M. & Touboul, M. (1992). J. Appl. Cryst. 25, 617-623.
23. Mary, C., Guinebretière, R., Trolliard, G., Soulestin, B., Villechaize, P. & Dauger, A. (1998). Thin Solid Films, 336, 156-159.
24. Masson, O., Boulle, A., Guinebretière, R., Lecomte, A. & Dauger, A. (2005). Rev. Sci. Instrum. 76, 063912, 1-7.
25. Masson, O., Guinebretière, R. & Dauger, A. (1996). J. Appl. Cryst. 29, 540-546.
26. Masson, O., Guinebretière, R. & Dauger, A. (1998). Mater. Sci. Forum, 278-281, 115-120.
27. Misture, S. T., Hubbard, C. R. &Wang, X. L. (2002). Adv. X-ray Anal. 45, 25-30.
28. Muller, F., Rannou, I., Duclaux, L. & Guet, J. M. (1997). J. Appl. Cryst. 30, 557-558.
29. Norton, D. P. (2004). Mater. Sci. Eng. R, 43 139-247.
30. Petras, L., Preisinger, A. & Mereiter, K. (1998). Mater. Sci. Forum, 278-281, 396-401.
31. Pietsch, U., Holy, V. & Baumbach, T. (2004). High-Resolution X-ray Scattering, 2nd ed. New York: Springer.
32. Sankar, G., Wright, P. A., Natarajan, S., Thomas, J. M., Greaves, G. N., Dent, A. J., Dobson, B. R., Ramsdale, C. A. & Jones, R. H. (1993). J. Phys. Chem. 97, 9550-9554.
33. Ståhl, K. & Hanson, S. (1994). J. Appl. Cryst. 27, 543-550.
34. Stephenson, G. B., Fong, D. D., Ramana Murty, M. V., Streiffer, S. K., Eastman, J. A., Auciello, O., Fuoss, P. H., Munkholm, A., Aanerud, M. E. M. & Thompson, C. (2003). Physica B, 336, 81-89.
35. Thomas, P., Mercurio, J. P. & Frit, B. (1989). J. Mater. Sci. Lett. 8, 52-54.
36. Thompson, C. V. (1990). Annu. Rev. Mater. Sci. 20, 245-268.
37. Touloukian, Y. S., Kirby, R. K., Taylor, R. E. & Lee, T. Y. R. (1977). Thermophysical Properties of Matter, Vol. 13. New York: Plenum.