Reflection Asymmetric Powder Diffraction with Flat-Plate Sample using a Curved Position-Sensitive Detector (INEL CPS 120)

Journal of Applied Crystallography

Volumn 29 PART 5, Issue , 1996, Pages 540-546

  Masson, Olivier ^a   Guinebretière, René ^a   Dauger, Alain ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542513318     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896004839     Document Type: Article

References (19)

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