High-resolution X-ray diffraction from microstructures

Ferroelectrics

Volumn 194, Issue 1-4, 1997, Pages 149-159

  Chrosch, Jutta ^a   Salje, Ekhard K H ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Domains; Microstructure; Tweed; Twins; X ray diffraction

Indexed keywords

CRYSTAL MICROSTRUCTURE; DIFFRACTOMETERS; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION ANALYSIS;

FERROELASTIC MATERIALS; TWEED; TWINS;

CRYSTALLINE MATERIALS; FERROELECTRIC MATERIALS;

EID: 0030609261     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199708016089     Document Type: Article

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