X-ray powder diffraction quantitative analysis performed in situ at high temperature: Application to the determination of NiO in ceramic pigments

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 808-813

  Gualtieri, Alessandro F ^a   Mazzucato, Edoardo ^a   Venturelli, Paolo ^a   Viani, Alberto ^a   Zannini, Paolo ^a   Petras, Laszlo ^b  

^a UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005404680     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899005853     Document Type: Article

References (8)

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2. Bish, L. B. & Post, J. B. (1993). Am. Mineral. 78, 932-940.
3. Fei, Y. (1995). Mineral Physics and Crystallography. A Handbook of Physical Constants. AGU Reference Shelf 2. Washington, DC: American Geophysical Union.
4. Gorton, A. T., Bitsianes, G. & Joseph, T. L. (1965). Trans. Met. Soc. AIME, 233, 1519-1525.
5. Gualtieri, A. F. (1996). Powder Diff. 11, 97-106.
6. Waerenborgh, J. C., Figuereido, M. O., Cabral, M. P. & Pereira, L. C. J. (1994). J. Solid State Chem. 111, 300-309.
7. Yates, B. (1972). Thermal Expansion. New York: Plenum.
8. Young, R. A. (1993). The Rietveld Method. IUCr Monographs on Crystallography 5. Oxford University Press.