Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 256, Issue 1, 2007, Pages 313-318

  El Said, A S ^a   Aumayr, F ^a   Della Negra, S ^b   Neumann, R ^c   Schwartz, K ^c   Toulemonde, M ^d   Trautmann, C ^c   Voss, K O ^c  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^c GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^d Centre Interdisciplinaire de Recherche Ions Lasers   (France)

Author keywords

C60 clusters; CaF2; Electronic energy loss; LaF3; SFM

Indexed keywords

ATOMIC FORCE MICROSCOPY; HEAVY IONS; LANTHANUM COMPOUNDS; PARTICLE ACCELERATORS; SINGLE CRYSTALS; SURFACE DEFECTS; SURFACE TOPOGRAPHY;

ELECTRONIC ENERGY LOSS; HILLOCK LIKE STRUCTURES; SWIFT HEAVY IONS; TOPOGRAPHIC IMAGES;

CALCIUM FLUORIDE;

EID: 33947119566     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.025     Document Type: Article

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