Heavy ion induced damage in MgF2 crystals

Radiation Effects and Defects in Solids

Volumn 157, Issue 6-12, 2002, Pages 649-654

  El Said, A S ^a,b   Neumann, R ^a   Schwartz, K ^a   Trautmann, C ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

^b Mansoura University   (Egypt)

Author keywords

MgF2; Optical spectroscopy; Scanning force microscopy; Swelling

Indexed keywords

CRYSTAL DEFECTS; CRYSTALS; FLUORINE COMPOUNDS; HEAVY IONS; MAGNESIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; SWELLING;

MGF2; OPTICAL SPECTROSCOPY; SCANNING FORCE MICROSCOPY; VOLUME EXPANSION;

RADIATION DAMAGE;

EID: 27344444776     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150215795     Document Type: Article

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