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Surface and Coatings Technology
Volumn 158, Issue 159, 2002, Pages 522-525
Scanning force microscopy of heavy-ion induced damage in lanthanum fluoride single crystals
(4)
El Said, A S
a
Neumann, R
a
Schwartz, K
a
Trautmann, C
a
a
GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH
(
Germany
)
Author keywords
Heavy ions; Lanthanum fluoride; Scanning force microscopy
Indexed keywords
HEAVY IONS; IRRADIATION; SINGLE CRYSTALS;
BAND GAP; SCANNING FORCE MICROSCOPY;
LANTHANUM COMPOUNDS;
DAMAGE;
EID
:
0036396854
PISSN
:
02578972
EISSN
:
None
Source Type
:
Journal
DOI
:
10.1016/S0257-8972(02)00295-5
Document Type
:
Article
Times cited : (
25
)
References (
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