메뉴 건너뛰기




Volumn 158, Issue 159, 2002, Pages 522-525

Scanning force microscopy of heavy-ion induced damage in lanthanum fluoride single crystals

Author keywords

Heavy ions; Lanthanum fluoride; Scanning force microscopy

Indexed keywords

HEAVY IONS; IRRADIATION; SINGLE CRYSTALS;

EID: 0036396854     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(02)00295-5     Document Type: Article
Times cited : (25)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.