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Volumn 240, Issue 4, 2005, Pages 819-828

Characterization of swift heavy ion tracks in CaF2 by scanning force and transmission electron microscopy

Author keywords

CaF 2; Scanning force microscopy; Swift heavy ions tracks; Tapping mode

Indexed keywords

CONVOLUTION; FLUORINE COMPOUNDS; HEAVY IONS; IRRADIATION; SCANNING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 27744606777     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.06.220     Document Type: Article
Times cited : (89)

References (47)
  • 10
    • 27744471629 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Caen
    • S. Schlutig, Ph.D. Thesis, University of Caen, 2002.
    • (2002)
    • Schlutig, S.1
  • 12
    • 27744489417 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Caen
    • N. Khlafaoui, Ph.D. Thesis, University of Caen, 2004.
    • (2004)
    • Khlafaoui, N.1
  • 35
    • 0000235265 scopus 로고
    • J.P. Biersack, and L.G. Haggmark Nucl. Instr. and Meth. 174 1980 257 Note in order to be consistent with previous experiments [ 27,29 ], we use the older version of TRIM95 instead of SRIM
    • (1980) Nucl. Instr. and Meth. , vol.174 , pp. 257
    • Biersack, J.P.1    Haggmark, L.G.2
  • 45
    • 27744519818 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Heidelberg
    • A.S. El-Said, Ph.D. Thesis, University of Heidelberg, 2004.
    • (2004)
    • El-Said, A.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.