Experimental confirmation of the EPES sampling depth paradox for overlayer/substrate systems

Surface Science

Volumn 601, Issue 6, 2007, Pages 1536-1543

  Vos, M ^a   Went, M R ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Elastic electron scattering; Thin films

Indexed keywords

ELASTIC SCATTERING; ELECTRONS; KINETIC ENERGY; SUBSTRATES; THIN FILMS;

ELASTIC ELECTRON SCATTERING; ELASTIC PEAK ELECTRON SPECTROSCOPY (EPES); ENERGY SEPARATION;

ELECTRON SPECTROSCOPY;

EID: 33847753480     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.01.014     Document Type: Article

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