Interface effect for EPES sampling depth for overlayer/substrate systems

Surface Science

Volumn 600, Issue 20, 2006, Pages 4735-4740

  Zommer, L ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

Aluminium; Computer simulations; Electron solid interactions, scattering; EPES; Gold; Monte Carlo algorithm; Nickel; Rhodium

Indexed keywords

ELASTIC PEAK ELECTRON SPECTROSCOPY (EPES); ELECTRON-SOLID INTERACTIONS; INTERFACE EFFECT;

ALUMINUM; COMPUTER SIMULATION; GOLD; INTERFACES (MATERIALS); MONTE CARLO METHODS; NICKEL; RHODIUM; SCATTERING; SUBSTRATES;

ELECTRON SPECTROSCOPY;

EID: 33749992635     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.07.044     Document Type: Article

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