Quantitative XPS: Non-destructive analysis of surface nano-structures

Applied Surface Science

Volumn 100-101, Issue , 1996, Pages 1-10

  Tougaard, Sven ^a  

^a UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

MORPHOLOGY; NANOSTRUCTURED MATERIALS; NONDESTRUCTIVE EXAMINATION; PHOTOIONIZATION; SURFACES;

NANO METER DEPTH SCALE; PEAK INTENSITIES; PEAK SHAPES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030564304     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(96)00246-2     Document Type: Article

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