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Volumn 150, Issue 1, 2006, Pages 56-61
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EPES sampling depth paradox for overlayer/substrate system
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Author keywords
Aluminium; Computer simulations; Electron solid interactions; EPES; Gold; Monte Carlo algorithm; Nickel; Rhodium; Scattering
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Indexed keywords
ALGORITHMS;
ALUMINUM;
COMPUTER SIMULATION;
GOLD;
MIRRORS;
MONTE CARLO METHODS;
NICKEL;
RHODIUM;
SAMPLING;
SCATTERING;
SUBSTRATES;
ELASTIC PEAK ELECTRON SPECTROSCOPY;
ELECTRON-SOLID INTERACTIONS;
EPES;
MONTE CARLO ALGORITHMS;
ELECTRON SPECTROSCOPY;
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EID: 27744521528
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2005.09.005 Document Type: Article |
Times cited : (11)
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References (22)
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