Electron inelastic mean free path in solids as determined by electron Rutherford back-scattering

Journal of Electron Spectroscopy and Related Phenomena

Volumn 156-158, Issue , 2007, Pages 387-392

  Went, M R ^a   Vos, M ^a   Elliman, R G ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

Elastic scattering; Inelastic mean free path; Thin film analysis

Indexed keywords

AMORPHOUS CARBON; ELECTRON SPECTROSCOPY; GOLD COMPOUNDS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS;

INCIDENT ELECTRONS; INELASTIC MEAN FREE PATH; RESOLUTION ELECTRON SPECTROMETERS; THIN FILM ANALYSIS;

ELASTIC SCATTERING;

EID: 34247101463     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2006.11.041     Document Type: Article

References (14)

1. Boersch H., Wolter R., and Schoenebeck H. Z. Phys. 199 (1967) 124
2. Vos M. Phys. Rev. A 65 (2002) 12703
3. Fielding A., Timms D., and Mayers J. Europhys. Lett. 44 (1998) 255
4. Went M., and Vos M. Surf. Sci. 600 (2006) 2070
5. Tanuma S., Powell C., and Penn D. Surf. Interf. Anal. 20 (1993) 77
6. Salvat F., Jablonski A., and Powell C. Comput. Phys. Commun. 165 (2005) 157
7. Werner W., Cabela T., Zemek J., and Jiricek P. Surf. Sci. 470 (2001) 325
8. Werner W., Tomatik C., Cabela T., Richter G., and Störi H. J. Electron Spectrosc. Relat. Phenom. 113 (2001) 127
9. Malis T., Cheng S., and Egerton R. J. Electron Micros. Technol. 8 (1988) 193
10. Vos M., Cornish G.P., and Weigold E. Rev. Sci. Inst. 71 (2000) 3831
11. Templier C., Muzard S., Galdikas A., Pranevicius L., Delafond J., and Desoyer J. Surf. Coat. Technol. 125 (2000) 129
12. Shirley D.A. J. Phys. B: At. Mol. Phys. 5 (1972) 4709
13. Jablonski A., Salvat F., and Powell C. Surf. Interf. Anal. 37 (2005) 1115
14. Vos M., and Went M. Phys. Rev. B 74 (2006) 205407