Monitoring interface traps in operating organic light-emitting diodes using impedance spectroscopy

Thin Solid Films

Volumn 515, Issue 11, 2007, Pages 4783-4787

  Pingree, L S C ^a   Russell, M T ^b   Marks, T J ^a,b   Hersam, M C ^a  

^a Northwestern University   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Indium tin oxide; Negative capacitance; Optoelectronic devices; Surface and interface states

Indexed keywords

CAPACITANCE; ELECTRON TRAPS; INDIUM COMPOUNDS; INTERFACES (MATERIALS); OPTOELECTRONIC DEVICES; SPECTROSCOPIC ANALYSIS;

HOLE TRANSPORT LAYER; INDIUM TIN OXIDE; INTERFACE STATES; NEGATIVE CAPACITANCE;

LIGHT EMITTING DIODES;

EID: 33847158883     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2006.11.186     Document Type: Article

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