A novel stuck-at based method for transistor stuck-open fault diagnosis

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 378-386

  Fan, Xinyue ^a   Moore, Will ^a   Hora, Camelia ^b   Gronthoud, Guido ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Digital circuit; Fault diagnosis; Stuck open fault

Indexed keywords

FAULT DIAGNOSIS; STUCK-OPEN FAULT;

DIGITAL CIRCUITS; GATES (TRANSISTOR); MATHEMATICAL MODELS; SILICON WAFERS; TRANSISTORS;

ELECTRIC FAULT LOCATION;

EID: 33847135606     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1583996     Document Type: Conference Paper

References (13)

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