Transistor stuck-open fault detection in multilevel CMOS circuits

Proceedings of the IEEE Great Lakes Symposium on VLSI

Volumn , Issue , 1999, Pages 388-391

  Abd El Barr, Mostafa ^a   Xu, Yanging ^a   McCrosky, Carl ^a  

^a KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS   (Saudi Arabia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMBINATORIAL CIRCUITS; EQUIVALENT CIRCUITS; ERROR ANALYSIS; ERROR DETECTION; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUIT TESTING; LOGIC GATES;

CMOS TESTING; FAULT COVERAGE; MULTILEVEL CMOS CIRCUITS; ROBUST TEST GENERATION; STUCK OPEN FAULT DETECTION; TWO PATTERN TEST;

CMOS INTEGRATED CIRCUITS;

EID: 0033329662     PISSN: 10661395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)