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Volumn 3, Issue 2, 2006, Pages 35-44

CVD delta-doped boron surface layers for ultra-shallow junction formation

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; BORON; CHEMICAL VAPOR DEPOSITION; DIODES; DOPING (ADDITIVES); ELECTRIC PROPERTIES; SILICON;

EID: 33846957657     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2356262     Document Type: Conference Paper
Times cited : (28)

References (16)
  • 12
    • 33846978157 scopus 로고    scopus 로고
    • L. K. Nanver, J. Slabbekoorn, A. Burtsev, T. L. M. Scholtes, R. Surdeanu, F. Simon, H.-J. Kalhert, and J. W. Slotboom, in Advanced Short-Time Thermal Processing for Si-Based CMOS Devices/2003, F. Roozeboom, E. Gusev, L.-J. Chen, M. C. Ozturk, D.-L. Kwong, and P. J. Timans, Editors, PV 03-14, p. 119, The Electrochemical Society Proceedings Series, Pennington, NJ (2003).
    • L. K. Nanver, J. Slabbekoorn, A. Burtsev, T. L. M. Scholtes, R. Surdeanu, F. Simon, H.-J. Kalhert, and J. W. Slotboom, in Advanced Short-Time Thermal Processing for Si-Based CMOS Devices/2003, F. Roozeboom, E. Gusev, L.-J. Chen, M. C. Ozturk, D.-L. Kwong, and P. J. Timans, Editors, PV 03-14, p. 119, The Electrochemical Society Proceedings Series, Pennington, NJ (2003).
  • 14
    • 33847002058 scopus 로고    scopus 로고
    • Ph. D. dissertation, Delft University of Technology, Delft, The Netherlands, ISBN 90-9015824-3
    • Q. Ren, Novel Contacts and Diodes for Advanced Silicon Technology, p. 84, Ph. D. dissertation, Delft University of Technology, Delft, The Netherlands, ISBN 90-9015824-3 (2002).
    • (2002) Novel Contacts and Diodes for Advanced Silicon Technology , pp. 84
    • Ren, Q.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.