Bridge defect diagnosis with physical information

Proceedings of the Asian Test Symposium

Volumn 2005, Issue , 2005, Pages 248-253

  Zou, Wei ^a   Cheng, Wu Tung ^b   Reddy, Sudhakar M ^a  

^a UNIVERSITY OF IOWA   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; PRODUCT DESIGN; THRESHOLD VOLTAGE;

BRIDGE DEFECT DIAGNOSIS; BRIDGE RESISTANCE; DIAGNOSIS ACCURACY; DRIVE STRENGTHS;

CIRCUIT THEORY;

EID: 33846939826     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2005.32     Document Type: Conference Paper

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