Fault diagnosis for static CMOS circuits

Proceedings of the Asian Test Symposium

Volumn , Issue , 1997, Pages 282-287

  Xiaoqing, Wen ^a   Tamamoto, Hideo ^a   Saluja, Kewal K ^a   Kinoshita, Kozo ^a  

^a AKITA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

TRANSISTOR LEAKAGE FAULT;

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; TRANSISTORS; VECTORS;

INTEGRATED CIRCUIT TESTING;

EID: 0031336164     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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