Multiples, models, and the search for meaning: Improving per-test fault diagnosis

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 250-259

  Lavo, David B ^a   Hartanto, Ismed ^a   Larrabee, Tracy ^b  

^a AGILENT TECHNOLOGIES   (United States)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DEFECTS; FAILURE ANALYSIS; SEMICONDUCTOR DEVICE MODELS;

DIAGNOSIS ALGORITHMS; MODEL BASED FAULT DIAGNOSIS; PER TEST FAULT DIAGNOSIS;

SEMICONDUCTOR DEVICE TESTING;

EID: 0036446077     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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