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Volumn 84, Issue 3, 2007, Pages 454-459

Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; MULTILAYERS; OPTICAL PROPERTIES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

EID: 33846906180     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2006.10.060     Document Type: Article
Times cited : (9)

References (11)
  • 3
    • 33846938886 scopus 로고    scopus 로고
    • Product information of Bruker AXS and Philips AXR.
  • 6
    • 33846904650 scopus 로고    scopus 로고
    • C. Michaelsen, R. Bormann, Pat. Appl. WO 00/75646 A2.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.