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Volumn 84, Issue 3, 2007, Pages 454-459
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Quantitative TEM characterizations of La/B4C and Mo/B4C ultrathin multilayer gratings by the geometric phase method
c
Incoatec GmbH
*
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION GRATINGS;
MULTILAYERS;
OPTICAL PROPERTIES;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY ANALYSIS;
BRAGG DIFFRACTION;
GEOMETRIC PHASE METHOD;
X-RAY FILTERS;
LANTHANUM COMPOUNDS;
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EID: 33846906180
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2006.10.060 Document Type: Article |
Times cited : (9)
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References (11)
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