The effect of high-energy electron irradiation on ZnO-based ohmic and Schottky contacts

Semiconductor Science and Technology

Volumn 21, Issue 12, 2006, Pages 1656-1660

  Coskun, Cevdet ^a   Gedik, Nebi ^a   Balci, Ercan ^b  

^a ATATÜRK UNIVERSITY   (Turkey)

^b ATATURK UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; DIFFUSION; ELECTRON IRRADIATION; SCHOTTKY BARRIER DIODES;

CAPACITANCE-VOLTAGE MEASUREMENTS; HIGH ENERGY ELECTRON IRRADIATION; SCHOTTKY CONTACTS;

OHMIC CONTACTS;

EID: 33846884204     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/12/026     Document Type: Article

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