Radiation hardness of ZnO at low temperatures

Semiconductor Science and Technology

Volumn 19, Issue 6, 2004, Pages 752-754

  Coskun, C ^a,c   Look, D C ^a,b   Farlow, G C ^a   Sizelove, J R ^b  

^a WRIGHT STATE UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c ATATÜRK UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; HALL EFFECT; IONIZATION; PHOTONS; RADIATION HARDENING; SINGLE CRYSTALS; THERMOMETERS;

ANNIHILATION SPECTROSCOPY; ELECTRON SATURATION VELOCITY; FRENKEL PAIRS;

ZINC OXIDE;

EID: 2942584000     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/19/6/016     Document Type: Article

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