The optical, structural and morphological properties of ultrasonically sprayed ZnO:Mn films

Semiconductor Science and Technology

Volumn 21, Issue 12, 2006, Pages 1620-1626

  Akyuz, I ^a   Kose, S ^a   Atay, F ^a   Bilgin, V ^a  

^a ESKISEHIR OSMANGAZI UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

MORPHOLOGY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

ELEMENTAL ANALYSES; MORPHOLOGICAL PROPERTIES; TRANSMITTANCE SPECTRA;

SEMICONDUCTING FILMS;

EID: 33846852445     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/12/020     Document Type: Article

References (41)

1. Park Y R and Kim K J 2002 Solid State Commun. 123 147-50
2. Kohiki S, Nishitani M and Wada T 1994 J. Appl. Phys. 75 2069
3. Tominaga K, Umezu N, Mori I, Ushiro T, Moriga T and Nakabayashi I 1998 J. Vac. Sci. Technol. A 16 1213
4. Yoshikawa H and Adachi S 1997 Japan. J. Appl. Phys. 36 6327
5. Zhang X T, Liu Y C, Zhi Z Z, Zhang J Y, Lu Y M, Xu W, Shen D Z, Zhong G Z, Fan X W and Kong X G 2002 J. Cryst. Growth 240 463-6
6. Liu Y X, Liu Y C, Shen D Z, Zhong G Z, Fan X W, Kong X G, Mu R and Henderson D O 2002 J. Cryst. Growth 240 152-6
7. Tang Z K, Wang G K L, Yu P, Kawaski M, Ohtomo A, Koinuma H and Segawa Y 1998 Appl. Phys. Lett. 72 3270
8. Cao H, Zhao Y G, Ho S T, Seelig E W, Wang Q H and Chang R P H 1999 Phys. Rev. Lett. 82 2278
9. Paul G K and Sen S K 2002 Mater. Lett. 57 959-63
10. Tukumoto M S, Smith A, Santilli C V, Bulcinelli S H, Elkaim E and Briois V 2000 J. Non-Cryst. Solids 273 302-6
11. Nishino J, Kawarada T, Ohshio S, Saitoh H, Maruyama K and Kamata K 1997 J. Mater. Sci. Lett. 16 629
12. Hu W S, Liu Z G, Guo X L, Lin C, Zhu S N and Feng D 1995 Mater. Lett. 25 5
13. Wang R P, King L L H and Sleight A W 1996 J. Mater. Res. 11 1659
14. Ataev B M, Bagamadova A M, Djabrailov A M, Mamedov V V and Rabadanov R A 1995 Thin Solid Films 260 19
15. Caillaud F, Smith A and Baumard J F 1993 J. Eur. Ceram. Soc. 6 313
16. Messaoudi C, Sayah D and Abdlefdil M 1995 Phys. Stat. Sol. 151 93
17. Smith A and Rodriguez-Clemente R 1999 Thin Solid Films 341 1
18. Paul G K and Sen S K 2002 Mater. Lett. 57 742-6
19. Service R F 1997 Science 276 895
20. Fathollahi V and Amini M M 2001 Mater. Lett. 50 235
21. Water W and Chu S 2002 Mater. Lett. 55 67-72
22. Minami T, Sonohara H, Takata S and Sato H 1994 Japan. J. Appl. Phys. 33 L743
23. Bao D, Gu H and Kuang A 1998 Thin Solid Films 321 37
24. Kamalasanan M N and Chandra S 1996 Thin Solid Films 288 112
25. Bilgin V, Kose S, Atay F and Akyuz I 2004 Mater. Lett. 58 3686-93
26. Atay F, Kose S, Bilgin V and Akyuz I 2003 Mater. Lett. 57 3461-72
27. Atay F, Bilgin V, Akyuz I and Kose S 2003 Mater. Sci. Semicond. Process. 6 197-203
28. Kim H, Pique A, Horwitz J S, Murata P, Kafafi Z H, Gilmore C M and Chrisey D B 2000 Thin Solid Films 377-378 798-802
29. Brewer S H and Franzen S 2002 J. Alloys Compounds 338 73-9
30. Vigil O, Cirus F, Santana G, Vaillant L, Morales-Acevedo A and Contreras-Puente G 2000 Appl. Surf. Sci. 161 27-34
31. Bandyopadhyay S, Paul G K and Sen S K 2002 Sol. Energy Mater. Sol. Cells 71 103-3
32. Natsume Y and Sakata H 2000 Thin Solid Films 372 30-6
33. Pankove J I 1971 Optical Process in Semiconductors, Solid State Physical Electronics Series (Englewood Cliffs, NJ: Prentice-Hall) p 422
34. Baretta C and Massalaski T B 1966 Structure of Metals (New York: McGraw-Hill)
35. Afify H H, Nasser S A and Demian S E 1991 J. Mater. Sci., Mater. Electron. 2 152-6
36. Liu Y L, Liu Y C, Liu Y X, Shen D Z, Lu Y M, Zhang J Y and Fan X W 2002 Physica B 322 31-6
37. Gupta V and Mansingh A 1996 J. Appl. Phys. 80 1063
38. Sugiyama K, Taniguchi K and Kuwabara K 1990 J. Mater. Sci. Lett. 9 489
39. Jou J H, Han M Y and Cheng D J 1992 J. Appl. Phys. 71 4333
40. Williamson G B and Smallman R C 1956 Phil. Mag. 1 34
41. Velumani S, Narayandass Sa K and Mangalaraj D 1998 Semicond. Sci. Technol. 13 1016-24