Structural characterization of hot wall deposited cadmium selenide thin films

Semiconductor Science and Technology

Volumn 13, Issue 9, 1998, Pages 1016-1024

  Velumani, S ^a,b   Narayandass, Sa K ^a   Mangalaraj, D ^a  

^a BHARATHIAR UNIVERSITY   (India)

^b Coimbatore Institute of Technology   (India)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; CRYSTAL MICROSTRUCTURE; DEPOSITION; DISLOCATIONS (CRYSTALS); GLASS; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; THIN FILMS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

CADMIUM SELENIDE THIN FILMS; HOT WALL DEPOSITION METHOD;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032157928     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/9/009     Document Type: Article

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