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Volumn 16, Issue 7, 1997, Pages 770-776

On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT CURRENTS; ELECTRIC NETWORK ANALYSIS; INTEGRATED CIRCUIT LAYOUT;

EID: 0031175881     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.644039     Document Type: Article
Times cited : (23)

References (23)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.