Self-test circuit for evaluating memory sense-amplifier signal

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 217-225

  Adams, R Dean ^a   Cooley, Edmond S ^a   Hansen, Patrick R ^a  

^a DARTMOUTH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; RANDOM ACCESS STORAGE;

STATIC RANDOM ACCESS MEMORY (SRAM);

INTEGRATED CIRCUIT TESTING;

EID: 0031380352     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)