On-chip signal level evaluation for mixed-signal ICs using digital window comparators

Proceedings of the European Test Workshop

Volumn 2001, Issue , 2001, Pages 68-72

  De Venuto, D ^a   Ohletz, M J ^b   Ricco, B ^c  

^a POLITECNICO DI BARI   (Italy)

^b LUCENT TECHNOLOGIES   (United States)

^c UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARATORS (OPTICAL); DIGITAL LIBRARIES;

DIGITAL GATES; GATE CAPACITANCE; MIXED SIGNAL; OBSERVATION WINDOW; ON CHIPS; ON-CHIP SIGNALS; TEST INPUTS; WINDOW COMPARATOR;

MIXED SIGNAL INTEGRATED CIRCUITS;

EID: 27844563866     PISSN: 15301877     EISSN: 15581780     Source Type: Conference Proceeding    
DOI: 10.1109/ETW.2001.946664     Document Type: Conference Paper

References (8)

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