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1
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0001909165
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Functional verification methodology for microprocessors using the Genesys test-program generator
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March
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L. Fournier, Y. Arbetman, and M. Levinger, "Functional verification methodology for microprocessors using the Genesys test-program generator," in Proceedings of the 1999 Design, Automation and Test in Europe Conference, March 1999, pp. 434-441.
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Fournier, L.1
Arbetman, Y.2
Levinger, M.3
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3
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0029230835
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Test program generation for functional verification of PowerPC processors in IBM
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June
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A. Aharon, D. Goodman, M. Levinger, Y. Lichtenstein, Y. Malka, C. Metzger, M. Molcho, and G. Shurek, "Test program generation for functional verification of PowerPC processors in IBM," in Proceedings of the 32nd Design Automation Conference, June 1995, pp. 279-285.
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Proceedings of the 32nd Design Automation Conference
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Aharon, A.1
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Levinger, M.3
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Malka, Y.5
Metzger, C.6
Molcho, M.7
Shurek, G.8
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4
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0005409810
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Design verification of the HP9000 series 700 PARISC workstations
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August
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A. Ahi, G. Burroughs, A. Gore, S. LaMar, C. Linand, and A. Wieman, "Design verification of the HP9000 series 700 PARISC workstations," Hewlett-Packard Journal, vol. 14, no. 8, August 1992.
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Ahi, A.1
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Linand, C.5
Wieman, A.6
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6
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0005408892
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High quality behavioral verification using statistical stopping criteria
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March
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A. Hajjar, T. Chen, I. Munn, A. Andrews, and M. Bjorkman, "High quality behavioral verification using statistical stopping criteria," in Proceedings of the 2001 Design, Automation and Test in Europe Conference, March 2001, pp. 411-418.
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(2001)
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Hajjar, A.1
Chen, T.2
Munn, I.3
Andrews, A.4
Bjorkman, M.5
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7
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0031628215
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User defined coverage - a tool supported methodology for design verification
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June
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R. Grinwald, E. Harel, M. Orgad, S. Ur, and A. Ziv, "User defined coverage - a tool supported methodology for design verification," in Proceedings of the 35th Design Automation Conference, June 1998, pp. 158-165.
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(1998)
Proceedings of the 35th Design Automation Conference
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Grinwald, R.1
Harel, E.2
Orgad, M.3
Ur, S.4
Ziv, A.5
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8
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4444382729
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Defining coverage views to improve functional coverage analysis
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June
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S. Asaf, E. Marcus, and A. Ziv, "Defining coverage views to improve functional coverage analysis," in Proceedings of the 41st Design Automation Conference, June 2004, pp. 41-44.
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(2004)
Proceedings of the 41st Design Automation Conference
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Asaf, S.1
Marcus, E.2
Ziv, A.3
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9
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0036047838
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Hole analysis for functional coverage data
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June
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O. Lachish, E. Marcus, S. Ur, and A. Ziv, "Hole analysis for functional coverage data," in Proceedings of the 39th Design Automation Conference, June 2002, pp. 807-812.
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(2002)
Proceedings of the 39th Design Automation Conference
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Lachish, O.1
Marcus, E.2
Ur, S.3
Ziv, A.4
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10
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0042635846
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Coverage directed test generation for functional verification using Bayesian networks
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June
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S. Fine and A. Ziv, "Coverage directed test generation for functional verification using Bayesian networks," in Proceedings of the 40th Design Automation Conference, June 2003, pp. 286-291.
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(2003)
Proceedings of the 40th Design Automation Conference
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Fine, S.1
Ziv, A.2
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11
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27944504384
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A generic micro-architectural test plan approach for microprocessor verification
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June
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A. Adir, H. Azatchi, E. Bin, O. Peled, and K. Shoikhet, "A generic micro-architectural test plan approach for microprocessor verification," in Proceedings of the 42nd Design Automation Conference, June 2005, pp. 769-774.
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(2005)
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Adir, A.1
Azatchi, H.2
Bin, E.3
Peled, O.4
Shoikhet, K.5
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