Enhancing the control and efficiency of the covering process [logic verification]

Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT

Volumn 2003-January, Issue , 2003, Pages 96-101

  Fine, S ^a   Ziv, A ^a  

^a IBM HAIFA RESEARCH LAB   (Israel)

Author keywords

Automatic testing; Bayesian methods; Clustering algorithms; Engines; Event detection; Feedback; Hardware; Random number generation

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; BAYESIAN NETWORKS; COMPUTER HARDWARE; EFFICIENCY; ENGINES; FEEDBACK; MICROPROCESSOR CHIPS; RANDOM NUMBER GENERATION; STATISTICAL TESTS;

BAYESIAN METHODS; CLUSTERING TECHNIQUES; EVENT DETECTION; LOGIC VERIFICATION; TEST GENERATIONS; WATER FILLING;

CLUSTERING ALGORITHMS;

EID: 19944386818     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2003.1252481     Document Type: Conference Paper

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