Defining coverage views to improve functional coverage analysis

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 41-44

  Asaf, Sigal ^a   Marcus, Eitan ^a   Ziv, Avi ^a  

^a IBM HAIFA RESEARCH LAB   (Israel)

Author keywords

Coverage analysis; Functional verification

Indexed keywords

DATA REDUCTION; FUNCTIONS; INFORMATION ANALYSIS; INTEGRAL EQUATIONS; RANDOM PROCESSES; SET THEORY;

COVERAGE ANALYSIS; FUNCTIONAL VERIFICATION; SHEER SIZE; TIME-CONSUMING TASKS;

COMPUTER HARDWARE;

EID: 4444382729     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996579     Document Type: Conference Paper

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