Mosaic superstructure in manganese silicide films on Si (1 1 1) - (sqrt(3) × sqrt(3)) : Bi- α

Surface Science

Volumn 601, Issue 3, 2007, Pages 810-813

  Schwinge, K ^a   Paggel, J J ^b   Fumagalli, P ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

Low energy electron diffraction; Manganese; Manganese silicide; Scanning tunneling microscopy; Silicon

Indexed keywords

CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; MANGANESE COMPOUNDS; SCANNING TUNNELING MICROSCOPY; SILICON;

FLAT FILMS; GROWTH MODELS; MANGANESE SILICIDES;

THIN FILMS;

EID: 33846525043     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.012     Document Type: Article

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