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Volumn 37, Issue 7, 2004, Pages 1083-1090

Thin manganese films on Si(111)-(7 × 7): Electronic structure and strain in suicide formation

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; LOW ENERGY ELECTRON DIFFRACTION; PHOTOEMISSION; REACTION KINETICS; SEMICONDUCTING SILICON; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; STACKING FAULTS; STRAIN;

EID: 2342450026     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/7/021     Document Type: Article
Times cited : (64)

References (29)
  • 19
    • 2342609535 scopus 로고
    • PhD Thesis Technical University Berlin
    • Hasselblatt M 1988 PhD Thesis Technical University Berlin
    • (1988)
    • Hasselblatt, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.