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Volumn 37, Issue 7, 2004, Pages 1083-1090
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Thin manganese films on Si(111)-(7 × 7): Electronic structure and strain in suicide formation
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC STRUCTURE;
LOW ENERGY ELECTRON DIFFRACTION;
PHOTOEMISSION;
REACTION KINETICS;
SEMICONDUCTING SILICON;
SILICON COMPOUNDS;
SPECTROSCOPIC ANALYSIS;
STACKING FAULTS;
STRAIN;
PHOTOEMISSION SPECTROSCOPY (PES);
PHOTON ENERGY;
SURFACE ATOMS;
VALENCE LEVEL SPECTRA;
THIN FILMS;
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EID: 2342450026
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/37/7/021 Document Type: Article |
Times cited : (64)
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References (29)
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