Influence of growth rate on structural and optical properties of AlInGaN quaternary epilayers

Journal of Crystal Growth

Volumn 298, Issue SPEC. ISS, 2007, Pages 341-344

  Pan, Yaobo ^a   Yu, Tongjun ^a   Yang, Zhijian ^a   Wang, Huan ^a   Qin, Zhixin ^a   Hu, Xiaodong ^a   Wang, Kun ^a   Yao, Shude ^a   Zhang, Guoyi ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

A1. Atomic force micrograph; A1. Rutherford backscattering spectroscopy; A3. Metalorganic chemical vapor deposition; B1. AlInGaN Quaternary alloys

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS;

ATOMIC FORCE MICROGRAPHS; CRYSTALLINE QUALITY; QUATERNARY ALLOYS; QUATERNARY EPILAYERS;

EPITAXIAL GROWTH;

EID: 33846438620     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.10.150     Document Type: Article

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