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Volumn 53, Issue 6, 2006, Pages 3408-3416

An SEU-robust configurable logic block for the implementation of a radiation-tolerant FPGA

Author keywords

FPGA; Radiation tolerant; SET; SEU robust

Indexed keywords

COMBINATORIAL LOGIC; LOGIC BLOCK; RADIATION TOLERANCE;

EID: 33846329767     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.884097     Document Type: Conference Paper
Times cited : (10)

References (23)
  • 2
    • 0029459487 scopus 로고
    • Total dose responses of actel 1020B and 1280A field programmable gate arrays (FPGAs)
    • Arcachon, France, Sep
    • R. Katz, G. Swift, and D. Shaw, "Total dose responses of actel 1020B and 1280A field programmable gate arrays (FPGAs)," in Proc. Radiation and its Effect on Components and Systems (RADECS), Arcachon, France, Sep. 1995, p. 412.
    • (1995) Proc. Radiation and its Effect on Components and Systems (RADECS) , pp. 412
    • Katz, R.1    Swift, G.2    Shaw, D.3
  • 4
    • 33846277365 scopus 로고    scopus 로고
    • Single event functional interrupt (SEFI) sensitivity in eeproms
    • Greenbelt,MD, Sep, NASA Goddard Space Flight Center
    • R. Koga, "Single event functional interrupt (SEFI) sensitivity in eeproms," in Proc. Military and Aerospace Programmable Logic Device (MAPLD)Int. Conf., Greenbelt,MD, Sep. 1998, NASA Goddard Space Flight Center.
    • (1998) Proc. Military and Aerospace Programmable Logic Device (MAPLD)Int. Conf
    • Koga, R.1
  • 5
    • 1242287915 scopus 로고    scopus 로고
    • Single event upset and hardening in 0.15 μm antifuse-based field programmable gate array
    • Dec
    • J. Wang, W. Wong, S. Wolday, B. Cronquist, J. McCollum, R. Katz, and I. Kleyner, "Single event upset and hardening in 0.15 μm antifuse-based field programmable gate array," IEEE Trans. Nucl. Sci., vol. 50, no. 6, pp. 2158-2166, Dec. 2003.
    • (2003) IEEE Trans. Nucl. Sci , vol.50 , Issue.6 , pp. 2158-2166
    • Wang, J.1    Wong, W.2    Wolday, S.3    Cronquist, B.4    McCollum, J.5    Katz, R.6    Kleyner, I.7
  • 7
    • 0002913552 scopus 로고    scopus 로고
    • Design and Characterization of Radiation Tolerant Integrated Circuits in Deep Submicron CMOS Technologies for the LHC Experiments,
    • Ph.D. dissertation, Insitut National Polytechnique de Grenoble, Grenoble, France, Dec
    • G. Anelli, "Design and Characterization of Radiation Tolerant Integrated Circuits in Deep Submicron CMOS Technologies for the LHC Experiments," Ph.D. dissertation, Insitut National Polytechnique de Grenoble, Grenoble, France, Dec. 2000.
    • (2000)
    • Anelli, G.1
  • 8
    • 0002354984 scopus 로고    scopus 로고
    • Development of a radiation tolerant 2.0 V standard cell library using a commercial deep submicron CMOS technology for the LHC experiments
    • Rome, Italy, Sep
    • K. Kloukinas, F. Faccio, A. Marchioro, and P. Moreira, "Development of a radiation tolerant 2.0 V standard cell library using a commercial deep submicron CMOS technology for the LHC experiments," in Proc. 4th Workshop on Electronics for LHC Experiments, Rome, Italy, Sep. 1998.
    • (1998) Proc. 4th Workshop on Electronics for LHC Experiments
    • Kloukinas, K.1    Faccio, F.2    Marchioro, A.3    Moreira, P.4
  • 9
    • 0031367158 scopus 로고    scopus 로고
    • Comparison of error rates in combinational and sequential logic
    • Dec
    • S. Buchner, M. Baze, D. Brown, D. McMorrow, and J. Melinger, "Comparison of error rates in combinational and sequential logic," IEEE Trans. Nucl. Sci., vol. 44, no. 6, pp. 2209-2216, Dec. 1997.
    • (1997) IEEE Trans. Nucl. Sci , vol.44 , Issue.6 , pp. 2209-2216
    • Buchner, S.1    Baze, M.2    Brown, D.3    McMorrow, D.4    Melinger, J.5
  • 11
    • 0030375853 scopus 로고    scopus 로고
    • Upset hardened memory design for submicron CMOS technology
    • Dec
    • T. Calin, M. Nicolaidis, and R. Velazco, "Upset hardened memory design for submicron CMOS technology," IEEE Trans. Nucl. Sci., vol. 43, no. 6, pp. 2874-2878, Dec. 1996.
    • (1996) IEEE Trans. Nucl. Sci , vol.43 , Issue.6 , pp. 2874-2878
    • Calin, T.1    Nicolaidis, M.2    Velazco, R.3
  • 12
    • 33846318269 scopus 로고    scopus 로고
    • Measurement of SEU on the module controller chip of the ATLAS pixel detector
    • Snowmass, CO, Jun
    • G. Gagliardi, "Measurement of SEU on the module controller chip of the ATLAS pixel detector," in Proc. 5th Int. Meeting on Front-End Electronics, Snowmass, CO, Jun. 2003.
    • (2003) Proc. 5th Int. Meeting on Front-End Electronics
    • Gagliardi, G.1
  • 13
    • 33846287675 scopus 로고    scopus 로고
    • Enhanced fault-tolerant data latches for deep submicron CMOS
    • Las Vegas, NV, Jun
    • D. Blum, M. Myjak, and J. Delgado-Frias, "Enhanced fault-tolerant data latches for deep submicron CMOS," in Proc. Int. Conf. Computer Design (CDES), Las Vegas, NV, Jun. 2005, pp. 28-34.
    • (2005) Proc. Int. Conf. Computer Design (CDES) , pp. 28-34
    • Blum, D.1    Myjak, M.2    Delgado-Frias, J.3
  • 14
    • 33846294116 scopus 로고    scopus 로고
    • An ultra-low power, radiation tolerant, high speed correlator
    • Coeur D'Alene, ID, May
    • K. Hass and J. Piepmeier, "An ultra-low power, radiation tolerant, high speed correlator," in Proc. 11th NASA VLSI Design Symp., Coeur D'Alene, ID, May 2003.
    • (2003) Proc. 11th NASA VLSI Design Symp
    • Hass, K.1    Piepmeier, J.2
  • 15
    • 0026373079 scopus 로고
    • SEU hardened memory cells for a CCSDS reed solomon encoder
    • Dec
    • S. Whitaker, J. Canaris, and K. Liu, "SEU hardened memory cells for a CCSDS reed solomon encoder," IEEE Trans. Nucl. Sci., vol. 38, no. 6, pp. 1471-1477, Dec. 1991.
    • (1991) IEEE Trans. Nucl. Sci , vol.38 , Issue.6 , pp. 1471-1477
    • Whitaker, S.1    Canaris, J.2    Liu, K.3
  • 16
    • 11044226023 scopus 로고    scopus 로고
    • Edge triggered pulse latch design with delayed latching edge for radiation hardened application
    • Dec
    • W. Wang and H. Gong, "Edge triggered pulse latch design with delayed latching edge for radiation hardened application," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3626-3630, Dec. 2004.
    • (2004) IEEE Trans. Nucl. Sci , vol.51 , Issue.6 , pp. 3626-3630
    • Wang, W.1    Gong, H.2
  • 17
    • 0030104113 scopus 로고    scopus 로고
    • A comparison of fault-tolerant state machines architectures for space-borne electronics
    • Mar
    • S. Niranjan and J. Frenzel, "A comparison of fault-tolerant state machines architectures for space-borne electronics," IEEE Trans. Reliab., vol. 45, no. 1, pp. 109-113, Mar. 1996.
    • (1996) IEEE Trans. Reliab , vol.45 , Issue.1 , pp. 109-113
    • Niranjan, S.1    Frenzel, J.2
  • 18
    • 33144490282 scopus 로고    scopus 로고
    • SEU performance of TAG based flip-flops
    • Dec
    • R. Shuler, C. Kouba, and P. O'Neill, "SEU performance of TAG based flip-flops," IEEE Trans. Nucl. Sci., vol. 52, no. 6, pp. 2550-2553, Dec. 2005.
    • (2005) IEEE Trans. Nucl. Sci , vol.52 , Issue.6 , pp. 2550-2553
    • Shuler, R.1    Kouba, C.2    O'Neill, P.3
  • 19
    • 0027627693 scopus 로고
    • Architecture of field-programmable gate arrays
    • Jul
    • J. Rose, A. El Gamal, and A. Sangiovanni-Vincetelli, "Architecture of field-programmable gate arrays," in Proc. IEEE, Jul. 1993, vol. 81, no. 7, pp. 1013-1028.
    • (1993) Proc. IEEE , vol.81 , Issue.7 , pp. 1013-1028
    • Rose, J.1    El Gamal, A.2    Sangiovanni-Vincetelli, A.3
  • 20
    • 0034246091 scopus 로고    scopus 로고
    • Computational method to estimate Single Event Upset rates in an accelerator environment
    • June
    • M. Huhtinen and F. Faccio, "Computational method to estimate Single Event Upset rates in an accelerator environment," Nucl. Instrum. Methods Phys. Res. A, no. A450, pp. 155-172, June 2000.
    • (2000) Nucl. Instrum. Methods Phys. Res. A , Issue.A450 , pp. 155-172
    • Huhtinen, M.1    Faccio, F.2
  • 22
    • 33846313734 scopus 로고    scopus 로고
    • K. Hagiwara, Physical Review D ser. III, The American Physical Society, Jul. 2002, 66, no. 1-1, pp. 010 001-229, I, ch. 31-Statistics.
    • K. Hagiwara, Physical Review D ser. III, The American Physical Society, Jul. 2002, vol. 66, no. 1-1, pp. 010 001-229, I, ch. 31-Statistics.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.