메뉴 건너뛰기




Volumn 2005, Issue , 2005, Pages 229-233

The impact of zincation on the electroless nickel UBM for low cost flip chip technology

Author keywords

Electroless nickel plating; Low cost flip chip; Zincation

Indexed keywords

ADHESION; ALUMINUM ALLOYS; ELECTRIC RESISTANCE; NICKEL ALLOYS; SOLDERING; SURFACE ROUGHNESS; THIN FILMS;

EID: 33846324337     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2005.1564662     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 1
    • 33846329183 scopus 로고    scopus 로고
    • Simulation and Optimization of solution flow in fountain plating cup for Au bumping
    • Shanghai, China, Oct
    • th Int. Conf. Electron. Packaging Tech. (ICEPT), Shanghai, China, Oct. 2003, pp. 110-114.
    • (2003) th Int. Conf. Electron. Packaging Tech. (ICEPT) , pp. 110-114
    • Hu, T.1
  • 2
    • 0033338716 scopus 로고    scopus 로고
    • A new flip-chip bonding technique using micromachined conductive polymer bumps
    • Oh K.W., et al, "A new flip-chip bonding technique using micromachined conductive polymer bumps", IEEE Tran. Adva. Packag., Vol. 22, No. 4 (1999), pp. 586-591.
    • (1999) IEEE Tran. Adva. Packag , vol.22 , Issue.4 , pp. 586-591
    • Oh, K.W.1
  • 4
    • 0042594279 scopus 로고    scopus 로고
    • The morphologies and the chemical states of the multiple zinacating deposits on Al pads of Si chips
    • Lin K.-L., et al, "The morphologies and the chemical states of the multiple zinacating deposits on Al pads of Si chips", Thin Soid Films, Vol.288, No. 11 (1996), pp. 36-40.
    • (1996) Thin Soid Films , vol.288 , Issue.11 , pp. 36-40
    • Lin, K.-L.1
  • 5
    • 0031078182 scopus 로고    scopus 로고
    • Fabrication of nickel microbump on aluminum using electroless nickel plating
    • Watanabe H., et al, "Fabrication of nickel microbump on aluminum using electroless nickel plating", J. Electrochem. Soc., Vol.144, No. 2(1997), pp. 471-476.
    • (1997) J. Electrochem. Soc , vol.144 , Issue.2 , pp. 471-476
    • Watanabe, H.1
  • 6
    • 0021483697 scopus 로고
    • A study of modified alloy zincate pretreatments for palting on aluminum part I - Electron microscope observation of the immersion formed film on aluminium substrates
    • Monteiro F.J., et al, "A study of modified alloy zincate pretreatments for palting on aluminum part I - Electron microscope observation of the immersion formed film on aluminium substrates", Tran. Inst. Met. Fin., Vol.62, No.1 (1984), pp. 98-103.
    • (1984) Tran. Inst. Met. Fin , vol.62 , Issue.1 , pp. 98-103
    • Monteiro, F.J.1
  • 7
    • 0022014074 scopus 로고
    • A study of modified alloy zincate pretreatments for palting on aluminum part II - Elemental distribution in the film formed during immersion treatments
    • Monteiro F.J., et al, "A study of modified alloy zincate pretreatments for palting on aluminum part II - Elemental distribution in the film formed during immersion treatments", Tran. Inst. Met. Fin., Vol.62, No.1 (1984), pp. 155-159.
    • (1984) Tran. Inst. Met. Fin , vol.62 , Issue.1 , pp. 155-159
    • Monteiro, F.J.1
  • 8
    • 0024716372 scopus 로고
    • Electroless nickel plating on aluminum connectors
    • Thurlow K.P., "Electroless nickel plating on aluminum connectors", Tans. Inst. Met. Fin., Vol.67, No.1(1989), pp. 82-86.
    • (1989) Tans. Inst. Met. Fin , vol.67 , Issue.1 , pp. 82-86
    • Thurlow, K.P.1
  • 9
    • 0036505187 scopus 로고    scopus 로고
    • Electroless nickel bumping of aluminum bondpads - part I: Surface pretreatment and activation
    • Hutt D.A., et al, "Electroless nickel bumping of aluminum bondpads - part I: Surface pretreatment and activation", IEEE Tran. Comp. Packag. Technol., Vol.25, No. 1(2002), pp. 87-97.
    • (2002) IEEE Tran. Comp. Packag. Technol , vol.25 , Issue.1 , pp. 87-97
    • Hutt, D.A.1
  • 10
    • 0037051216 scopus 로고    scopus 로고
    • Zincating morphology of aluminum bond pad: Its influence on quality of electroless nickel bumping
    • Qi G., et al, "Zincating morphology of aluminum bond pad: Its influence on quality of electroless nickel bumping", Thin Solid Films, Vol. 406, No. 2(2002), pp. 219-223.
    • (2002) Thin Solid Films , vol.406 , Issue.2 , pp. 219-223
    • Qi, G.1
  • 11
    • 84954219534 scopus 로고    scopus 로고
    • Infulences of pad shape and solder microstructure on shear force of low cost flip chip bumps
    • Hong Kong, China
    • Cai J., et al, "Infulences of pad shape and solder microstructure on shear force of low cost flip chip bumps", Proc. IEEE/CPMT Int. Electron. Manufact. Technol. Symp. (IEMTS), Hong Kong, China, 2000, pp. 91-98.
    • (2000) Proc. IEEE/CPMT Int. Electron. Manufact. Technol. Symp. (IEMTS) , pp. 91-98
    • Cai, J.1
  • 12
    • 0031209640 scopus 로고    scopus 로고
    • Adhesion of multilayer solder pads on silicon
    • Lin K.-L., et al, "Adhesion of multilayer solder pads on silicon", J. Mater. Sci.: Mater. Electron., Vol.8(1997), pp. 253-257.
    • (1997) J. Mater. Sci.: Mater. Electron , vol.8 , pp. 253-257
    • Lin, K.-L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.