A comparative study of Co thin film deposited on GaAs (1 0 0) and glass substrates

Materials Science and Engineering: B

Volumn 130, Issue 1-3, 2006, Pages 120-125

  Sharma, A ^a   Brajpuriya, R ^a   Tripathi, S ^a   Jain, D ^a   Dubey, R ^a   Shripathi, T ^a   Chaudhari, S M ^a  

^a University Grant Commission   (India)

Author keywords

AFM; Co thin film; GIXRR; PES; VSM; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; COBALT; FILM GROWTH; MAGNETIZATION; SEMICONDUCTING GALLIUM ARSENIDE; X RAY DIFFRACTION;

GRAZING INCIDENCE X-RAY REFLECTIVITY; PHOTOEMISSION SPECTROSCOPY; X RAY REFLECTIVITY;

THIN FILMS;

EID: 33846186886     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2006.02.065     Document Type: Article

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