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Volumn 24, Issue 1, 2006, Pages 74-77
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Study of annealed Co thin films deposited by ion beam sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTAL STRUCTURE;
GRAIN SIZE AND SHAPE;
ION BEAMS;
MAGNETIZATION;
STRESS RELAXATION;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CO THIN FILMS;
ION BEAM SPUTTERING;
MAGNETIZATION MEASUREMENTS;
COBALT;
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EID: 29344470121
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.2135292 Document Type: Article |
Times cited : (15)
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References (15)
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