메뉴 건너뛰기




Volumn 24, Issue 1, 2006, Pages 74-77

Study of annealed Co thin films deposited by ion beam sputtering

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL STRUCTURE; GRAIN SIZE AND SHAPE; ION BEAMS; MAGNETIZATION; STRESS RELAXATION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 29344470121     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2135292     Document Type: Article
Times cited : (15)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.