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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 20, Issue 4, 2002, Pages 1591-1599

Structure and interface composition of Co layers grown on As-rich GaAs(001) c(4×4) surfaces

(8) Ludge K a Schultz, B D b Vogt, P a Evans, M M R c Braun, W d Palmstrom C J b Richter, W a Esser, N a

a TECHNISCHE UNIVERSITÄT BERLIN (Germany)

b UNIVERSITY OF MINNESOTA (United States)

c UNIVERSITY OF WISCONSIN EAU CLAIRE (United States)

d HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; FILM GROWTH; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; MORPHOLOGY; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; STRUCTURE (COMPOSITION); THERMAL EFFECTS; ULTRAHIGH VACUUM; X RAY SPECTROSCOPY;

INTERFACE COMPOSITION; X RAY PHOTOEMISSION SPECTROSCOPY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0035982799 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.1491993 Document Type: Conference Paper

Times cited : (24)

References (24)

1
- 0035900398
- (2001) Science , vol.294 , pp. 1488
- Wolf, S.A.¹ Awschalom, D.D.² Buhrman, R.A.³ Daughton, J.M.⁴ Von Molnar, S.⁵ Roukes, M.L.⁶ Chtchelkanova, A.Y.⁷ Treger, D.M.⁸

2
- 3343004554
- (1985) Phys. Rev. Lett. , vol.54 , pp. 1051
- Prinz, G.A.¹

3
- 35949011615
- (1987) Phys. Rev. B , vol.35 , pp. 2375
- Xu, F.¹ Joyce, J.J.² Ruckmann, M.W.³ Chen, H.W.⁴ Boscherini, F.⁵ Hill, D.M.⁶ Chambers, S.A.⁷ Weaver, J.H.⁸

4
- 0032391545
- (1998) Surf. Rev. Lett. , vol.5 , pp. 285
- Ababou, S.¹ Lépine, B.² Pingel, R.³ Godefroy, A.⁴ Quémerais, A.⁵ Guivaracg, A.⁶ Jézéquel, G.⁷

5
- 0030145713
- (1996) Surf. Sci. , vol.352-354 , pp. 71
- Resch-Esser, U.¹ Esser, N.² Wang, D.T.³ Kuball, M.⁴ Zegenhagen, J.⁵ Fimland, B.O.⁶ Richter, W.⁷

6
- 0003047733
- (1987) J. Appl. Phys. , vol.62 , pp. 3755
- Palmstrøm, C.J.¹ Chang, C.C.² Yu, A.³ Galvin, J.⁴ Mayer, J.W.⁵

7
- 0005382737
- (1989) J. Appl. Phys. , vol.66 , pp. 5456
- Genut, M.¹ Eizenberg, M.²

8
- 0001358371
- (1987) J. Appl. Phys. , vol.62 , pp. 2070
- Sands, T.¹ Keramidas, V.G.² Yu, K.M.³ Washburn, J.⁴ Krishnan, K.⁵

9
- 51249178784
- (1988) J. Electron. Mater. , vol.17 , pp. 433
- Shiau, F.Y.¹ Chang, Y.A.² Chen, L.J.³

10
- 0000344010
- (1989) J. Appl. Phys. , vol.65 , pp. 4753
- Palmstrøm, C.J.¹ Fimland, B.-O.² Sands, T.³ Garrison, K.C.⁴ Bartynski, R.A.⁵

11
- 0029184340
- (1995) Surf. Sci. , vol.323 , pp. 91
- Avery, A.R.¹ Holmes, D.M.² Sudijono, J.³ Jones, T.S.⁴ Joyce, B.A.⁵

12
- 0028387002
- (1993) Surf. Interface Anal. , vol.21 , pp. 165
- Tanuma, S.¹ Powell, C.J.² Penn, D.R.³

13
- 0000503141
- edited by D. Briggs and M. P. Seah (Wiley, Chichester)
- (1990) Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy , pp. 201
- Seah, M.P.¹

14
- 30244509840
- (1970) J. Phys. C , vol.3 , pp. 285
- Doniach, S.¹ Sunjic, M.²

15
- 0005275257
- Proceedings of the 25th International Conference on the Physics of Semiconductors, Osaka, 2000 , pp. 293
- Ono, K.¹

16
- 33745725050
- (1991) Phys. Rev. B , vol.43 , pp. 14301
- Lay, G.L.¹ Mao, D.² Kahn, A.³ Hwu, Y.⁴ Margaritondo, G.⁵

17
- 0032688543
- (1999) J. Magn. Magn. Mater. , vol.198-199 , pp. 297
- Wu, Y.Z.¹ Ding, H.F.² Jing, C.³ Wu, D.⁴ Dong, G.S.⁵ Jin, X.F.⁶ Sun, K.⁷ Zhu, S.⁸

18
- 0024718652
- (1989) Z. Metallkd. , vol.80 , pp. 544
- Shiau, F.Y.¹ Zuo, Y.² Lin, J.C.³ Zheng, X.Y.⁴ Chang, Y.A.⁵

19
- 0026220063
- (1991) J. Less-Common Met. , vol.175 , pp. 155
- Lindeberg, I.¹ Anderson, Y.²

20
- 0003536561
- (ASM, Metals Park, Ohio)
- (1991) Pearson's Handbook of Crystallographic Data for Intermetallic Phases
- Villars, P.¹ Calvert, L.D.²

21
- 0001126713
- (1995) Annu. Rev. Mater. Sci. , vol.25 , pp. 389
- Palmstrøm, C.J.¹

22
- 23044521810
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 2057
- Chen, L.C.¹ Dong, J.W.² Schultz, B.D.³ Berezovsky, J.⁴ Isakovic, A.⁵ Crowell, P.A.⁶ Tabat, N.⁷ Palmstrøm, C.J.⁸

23
- 4244187861
- (1988) J. Vac. Sci. Technol. A , vol.6 , pp. 1456
- Palmstrøm, C.J.¹ Chase, E.W.² Hwang, D.M.³ Harbison, J.P.⁴ Chang, C.C.⁵ Kaplan, A.S.⁶ Nazar, L.⁷

24
- 0005388020
- these proceedings
- J. Vac. Sci. Technol. B
- Schultz, B.D.¹ Farrell, H.H.² Evans, M.M.R.³ Lüdge, K.⁴ Palmstrøm, C.J.⁵

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