Structural and magnetic properties of evaporated Co/Si(100) and Co/glass thin films

Journal of Physics D: Applied Physics

Volumn 37, Issue 18, 2004, Pages 2583-2587

  Kharmouche, A ^a,b   Cherif S M ^b   Bourzami, A ^a   Layadi, A ^a   Schmerber, G ^c  

^a FERHAT ABBAS UNIVERSITY   (Algeria)

^b UNIVERSITÉ PARIS 13   (France)

^c INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; COERCIVE FORCE; EVAPORATION; FERROMAGNETIC MATERIALS; GLASS; LIGHT SCATTERING; MAGNETIC ANISOTROPY; MAGNETIC PROPERTIES; SILICON COMPOUNDS; THICKNESS CONTROL; X RAY DIFFRACTION ANALYSIS;

MAGNETIC FORCE MICROSCOPY (MFM); MAGNETOCRYSTALLINE ANISOTROPY; MULTILAYER THIN FILMS; REMANENT MAGNETIZATION;

THIN FILMS;

EID: 4644262017     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/37/18/014     Document Type: Article

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