메뉴 건너뛰기




Volumn 90, Issue 1, 2007, Pages 77-83

Interrelation of ferroelectricity, morphology, and thickness in sol-gel-derived PbZrxTi1-xO3 films

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COERCIVE FORCE; FERROELECTRICITY; HYSTERESIS; LEAD COMPOUNDS; MICROSTRUCTURE; SOL-GELS;

EID: 33846147361     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2006.01371.x     Document Type: Article
Times cited : (11)

References (23)
  • 1
    • 0034228288 scopus 로고    scopus 로고
    • PZT Thin Films for Microsensors and Actuators, Where do We Stand?
    • P. Muralt, "PZT Thin Films for Microsensors and Actuators, Where do We Stand?," IEEE Trans. Ultras. Ferrotlectro. Freq. Contr., 47, 903-14 (2000).
    • (2000) IEEE Trans. Ultras. Ferrotlectro. Freq. Contr , vol.47 , pp. 903-914
    • Muralt, P.1
  • 2
    • 2942559048 scopus 로고    scopus 로고
    • Chemical Solution Deposition of Electronic Oxide Films
    • R. W. Schwartz, T. Schneller, and R. Waser, "Chemical Solution Deposition of Electronic Oxide Films," J.C.R. Chim., 7, 433-61 (2004).
    • (2004) J.C.R. Chim , vol.7 , pp. 433-461
    • Schwartz, R.W.1    Schneller, T.2    Waser, R.3
  • 3
    • 0000195589 scopus 로고    scopus 로고
    • Ferroelectric, Dielectric and Piezoelectric Properties of Ferroelectric Thin Films and Ceramics
    • D. Damjanovic, "Ferroelectric, Dielectric and Piezoelectric Properties of Ferroelectric Thin Films and Ceramics," Rep. Prog. Phys., 61, 1267-324 (1998).
    • (1998) Rep. Prog. Phys , vol.61 , pp. 1267-1324
    • Damjanovic, D.1
  • 4
    • 0032674735 scopus 로고    scopus 로고
    • 3 Films in the Thickness Range 0.25-10 μm
    • 3 Films in the Thickness Range 0.25-10 μm," J. Mater. Res., 14, 1852-9 (1999).
    • (1999) J. Mater. Res , vol.14 , pp. 1852-1859
    • Kurchania, R.1    Milne, S.J.2
  • 5
    • 4143058748 scopus 로고    scopus 로고
    • Electric and Longitudal Piezoelectric Properties of PZT (52/48) Films as a Function of Thickness Prepared by Diol Based Sol-Gel Method
    • J. Lee, K. Yoon, and T. Kim, "Electric and Longitudal Piezoelectric Properties of PZT (52/48) Films as a Function of Thickness Prepared by Diol Based Sol-Gel Method," Imegr. Ferroelectr., 41, 119-28 (2001).
    • (2001) Imegr. Ferroelectr , vol.41 , pp. 119-128
    • Lee, J.1    Yoon, K.2    Kim, T.3
  • 6
    • 0000895449 scopus 로고    scopus 로고
    • Injection Controlled Size Effect on Switching of Ferroelectric Thin Films
    • A. K. Tagantsev and I. A. Stolichnov, "Injection Controlled Size Effect on Switching of Ferroelectric Thin Films," Appl. Phys. Lett., 74, 1326-8 (1999).
    • (1999) Appl. Phys. Lett , vol.74 , pp. 1326-1328
    • Tagantsev, A.K.1    Stolichnov, I.A.2
  • 7
    • 36449003911 scopus 로고
    • 9, Thin Films and Their Influence on Fatigue Properties
    • 9, Thin Films and Their Influence on Fatigue Properties," J. Appl. Phys., 78, 5073-8 (1995).
    • (1995) J. Appl. Phys , vol.78 , pp. 5073-5078
    • Lee, J.J.1    Thio, C.L.2    Desu, S.B.3
  • 8
    • 0027961279 scopus 로고
    • Apparent Thickness Effect on Properties of Ferroelectric PZT Thin Layers
    • C. D. E. Lakeman and D. Payne, "Apparent Thickness Effect on Properties of Ferroelectric PZT Thin Layers," Ferroelectrics, 152, 145-50 (1994).
    • (1994) Ferroelectrics , vol.152 , pp. 145-150
    • Lakeman, C.D.E.1    Payne, D.2
  • 9
    • 0031599442 scopus 로고    scopus 로고
    • Metastability and Microstructure Evolution in Synthesis of Inorganics from Precursors
    • C. G. Levi, "Metastability and Microstructure Evolution in Synthesis of Inorganics from Precursors," Acta Mater., 46, 787-800 (1998).
    • (1998) Acta Mater , vol.46 , pp. 787-800
    • Levi, C.G.1
  • 11
    • 0030216163 scopus 로고    scopus 로고
    • Microstructural Development in Sol-Gel Derived Lead Zirconate Titanate Thin Films: The Role of Precursor Stoichiometry and Processing Environment
    • M. J. Levefre, J. S. Speck, R. W. Schwartz, D. Dimos, and S. J. Lockwood, "Microstructural Development in Sol-Gel Derived Lead Zirconate Titanate Thin Films: The Role of Precursor Stoichiometry and Processing Environment," J. Mater. Res., 11, 2076-83 (1996).
    • (1996) J. Mater. Res , vol.11 , pp. 2076-2083
    • Levefre, M.J.1    Speck, J.S.2    Schwartz, R.W.3    Dimos, D.4    Lockwood, S.J.5
  • 13
    • 0033723462 scopus 로고    scopus 로고
    • TEM Characterization of PZT Films Prepared by a Diol Route on Platinised Silicon Substrates
    • D. Kaewchinda, T. Chairaungsri, M. Naksata, S. J. Milne, and R. Brydson, "TEM Characterization of PZT Films Prepared by a Diol Route on Platinised Silicon Substrates," J. Eur. Ceram. Soc., 20, 1277-88 (2000).
    • (2000) J. Eur. Ceram. Soc , vol.20 , pp. 1277-1288
    • Kaewchinda, D.1    Chairaungsri, T.2    Naksata, M.3    Milne, S.J.4    Brydson, R.5
  • 14
    • 84985108261 scopus 로고
    • Processing Effects in the Sol-Gel Preparation of PZT Dried Gels, Powders and Ferroelectric Thin Layers
    • C. D. E. Lakeman and D. A. Payne, "Processing Effects in the Sol-Gel Preparation of PZT Dried Gels, Powders and Ferroelectric Thin Layers," J Am. Ceram. Soc., 5, 3091-6 (1992).
    • (1992) J Am. Ceram. Soc , vol.5 , pp. 3091-3096
    • Lakeman, C.D.E.1    Payne, D.A.2
  • 15
    • 0033677268 scopus 로고    scopus 로고
    • Structure Evolution During Processing of Polycryslalline Films
    • C. V. Thompson, "Structure Evolution During Processing of Polycryslalline Films," Annu. Rev. Mater. Sci., 30, 159-90 (2000).
    • (2000) Annu. Rev. Mater. Sci , vol.30 , pp. 159-190
    • Thompson, C.V.1
  • 19
    • 33745947336 scopus 로고    scopus 로고
    • Time- Temperature-Transformation (TTT) Diagram for Sol-Gel PZT Thin Films
    • S. B. Majumder, Y. N. Mohapatra, and D. C. Agrawal, "Time- Temperature-Transformation (TTT) Diagram for Sol-Gel PZT Thin Films," Ferroelectrics, 215, 1-9 (1998).
    • (1998) Ferroelectrics , vol.215 , pp. 1-9
    • Majumder, S.B.1    Mohapatra, Y.N.2    Agrawal, D.C.3
  • 20
    • 0029304642 scopus 로고
    • A Study of Process Variables on the Properties of PZT Films Produced by a Single-Layer Sol-Gel Technique
    • Y. L. Tu and S. J. Milne, "A Study of Process Variables on the Properties of PZT Films Produced by a Single-Layer Sol-Gel Technique," J. Mater. Sci., 30, 2507-16 (1995).
    • (1995) J. Mater. Sci , vol.30 , pp. 2507-2516
    • Tu, Y.L.1    Milne, S.J.2
  • 21
    • 1242310315 scopus 로고    scopus 로고
    • 3 Films on Platinized Silicon Substrates for Microdevices Applications
    • 3 Films on Platinized Silicon Substrates for Microdevices Applications," Jpn. J. Appl. Phys., 42, 7494-501 (2003).
    • (2003) Jpn. J. Appl. Phys , vol.42 , pp. 7494-7501
    • Park, J.1    Kim, S.2    Park, H.3    Ha, J.4    Kang, S.5
  • 23
    • 0035423490 scopus 로고    scopus 로고
    • Polarization Fatigue in Ferroelectric Films: Basic Experimental Findings Phenomenological Scenarios, and Microscopic Features
    • A. K. Tagantsev, I. Slolichnov, E. L. Colla, and N. Setter, "Polarization Fatigue in Ferroelectric Films: Basic Experimental Findings Phenomenological Scenarios, and Microscopic Features," J. Appl. Phys., 90, 1387-402 (2001).
    • (2001) J. Appl. Phys , vol.90 , pp. 1387-1402
    • Tagantsev, A.K.1    Slolichnov, I.2    Colla, E.L.3    Setter, N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.